Logic Probe High Frequency Response DTL TTL LP-1
The LP-1 logic probe supports in-circuit testing of DTL and TTL logic devices at a maximum frequency of 50 MHz.
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Description
The LP-1 logic probe can be used to perform in-circuit testing of DTL (Diode-Transistor Logic), TTL (Transistor-Transistor Logic), CMOS, and many other logic devices at a maximum operating frequency of 50 MHz.
Specifications
| Model | LP-1 |
| Function | Logic Probe |
| Max Frequency | 50 MHz |
| Supported Logic | DTL, TTL, CMOS |
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